The reliability
program will provide customers with real-time data on similar products. These products
will be tested on a continuous basis and the data will be accompanied by a certificate of
conformance. The data will be displayed in a graphical representation and plotted against
military standard criteria. Samples are selected at random by inspectors in the production
line. These samples are then sent to Quality Assurance for testing.
SAMPLES BEING SELECTED
SAMPLES ARE SELECTED AT RANDOM
SAMPLES ARE EITHER MSTF-2 OR MSTF-3 SERIES PARTS
SUBSTRATE MATERIAL IS EITHER SILICON OR CERAMIC
DATA IS ALSO TAKEN FROM PARTS THAT ARE CURRENTLY BEING
TESTED AND MEET THE PREVIOUS REQUIREMENTS
APPLICABLE MILITARY STANDARDS
MIL-PRF-55342, CHARACTERISTIC "H"
MIL-STD-202, METHOD 108 & 2011
TESTS BEING PERFORMED
LIFE
TEST...1000 HOURS (+72/-24), 70C (5C), 250mW
DELTA R REQUIREMENT 0.50%
THERMAL
SHOCK TEST...5 CYCLES, -65C (+0/-10) TO 150C (+10/-0)
DELTA R REQUIREMENT 0.25%
HIGH
TEMPERATURE EXPOSURE TEST...100 HOURS (4) AT 150C (5C)
DELTA R REQUIREMENT 0.20%
WIREBOND
EVALUATION ...THERMOSONIC, 1 MIL GOLD WIRE
3 GRAMS MINIMUM BOND PULL
DATA
DATA WILL BE SUPPLIED WITH CERTIFICATE OF CONFORMANCE
ON ORDERS THAT DO NOT REQUIRE TESTING
THIS DATA IS FOR TANTALUM AND NICHROME RESISTORS
FOR MORE INFORMATION, CONTACT MSI THIN FILM QUALITY ASSURANCE DEPARTMENT
:
Mini-Systems, Inc. Thin Film Division
20 David Road, P.O. Box 69, N. Attleboro, MA 02761-0069
Phone: (508) 226-2111 Fax: (508) 226-2211
Email: msithin@mini-systeminc.com