Thin Film

Thin Film Division

ISO 9001 CERTIFIED
MSIRP™, MINI-SYSTEMS, INC. RELIABILITY PROGRAM

The reliability program will provide customers with real-time data on similar products. These products are tested on a continuous basis and the data will accompany the certificate of conformance. The data will be displayed in a graphical representation and plotted against military standard criteria. Samples are selected at random by inspectors in the production line. These samples are then sent to Quality Assurance for testing.

SAMPLE SELECTION

  • SAMPLES ARE SELECTED AT RANDOM
  • SAMPLES ARE EITHER MSTF-2 OR MSTF-3 SERIES PARTS
  • SUBSTRATE MATERIAL IS EITHER SILICON OR CERAMIC
  • DATA IS ALSO TAKEN FROM PARTS THAT ARE CURRENTLY BEING TESTED AND MEET THE PREVIOUS REQUIREMENTS

APPLICABLE MILITARY STANDARDS

  • MIL-PRF-55342, CHARACTERISTIC “H”
  • MIL-STD-202
  • MIL-STD-883

TESTS PERFORMED

  • LIFE TEST
    • 1000 HOURS (+72/-24), 70°C (±5°C), 250mW
    • ΔR REQUIREMENT ±0.50%
  • THERMAL SHOCK TEST
    • 5 CYCLES, -65°C (+0/-10) TO 150°C (+10/-0)
    • ΔR REQUIREMENT ±0.25%
  • HIGH TEMPERATURE EXPOSURE TEST
    • 100 HOURS (±4) AT 150°C (±5°C)
    • ΔR REQUIREMENT ±0.20%
  • WIREBOND EVALUATION
    • THERMOSONIC, 1 MIL GOLD WIRE
    • 3 GRAMS MINIMUM BOND PULL

DATA

  • DATA WILL BE SUPPLIED WITH CERTIFICATE OF CONFORMANCE ON ORDERS THAT DO NOT REQUIRE TESTING
  • THIS DATA IS FOR TANTALUM AND NICHROME RESISTORS

FOR MORE INFORMATION CONTACT MSI QUALITY ASSURANCE DEPARTMENT
Mini-Systems, Inc. Thin Film Division
20 David Road, P.O. Box 69, North Attleboro MA 02761-0069
Phone: (508) 695-0203 Fax: (508) 695-6076

Charts representing Life Test data for Thin Film-Part 1 of 2

Charts representing Life Test data for Thin Film-Part 2 of 2

Thin Film Catalog (.pdf)

Contact Information

VP / General Mgr.: Richard Charbonneau – mail

Applications: Richard Charbonneau – mail

Quality Assurance: Felix Santilli – mail

 Sales Contact: Paula Boudreau (508) 695- 0203 – Fax: (508) 695-6076 – mail